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AN220339 - Test Scenarios of Unintended Power Cycles in Automotive Applications | Cypress Semiconductor

AN220339 - Test Scenarios of Unintended Power Cycles in Automotive Applications

최신 업데이트: 
2021년 3월 03일
버전: 
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It may not be possible to protect the power supply against an unintended power cycle and reset. Therefore, the MCU needs a safe reset logic to ensure that a correct reset always happens. This application note shows typical test scenarios for interruption or disturbance on a car power supply whereby the MCU cannot be powered up from a 0 V level.

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