You are here

AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates | Cypress Semiconductor

AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates

최신 업데이트: 
2020년 5월 28일
버전: 
*D
This application note describes the accelerated neutron testing procedure and test conditions that are applied during device qualification for Cypress SRAM devices. It covers Synchronous SRAM, Asynchronous SRAM, More Battery Life¿ MoBL®SRAM, and Nonvolatile SRAM (nvSRAM).

This application note describes the accelerated neutron testing procedure and test conditions that are applied during device qualification for Cypress SRAM devices. It covers Synchronous SRAM, Asynchronous SRAM, More Battery Life™ MoBL® SRAM, and Nonvolatile SRAM (nvSRAM) but does not contain soft error rate (SER) data for any of the SRAMs. Individual datasheets for Synchronous SRAMs list the derived accelerated neutron failure rates.

번역 문서는 참고용으로만 제공하는 것입니다. 설계 과정에 참여할 경우에는 영어 버전 문서를 참고하는 것이 좋습니다.