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AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates | Cypress Semiconductor

AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates

최신 업데이트: 
2021년 3월 02일
버전: 
*D
This application note describes the accelerated neutron testing procedure and test conditions that are applied during device qualification for Cypress SRAM devices. It covers Synchronous SRAM, Asynchronous SRAM, More Battery Life¿ MoBL®SRAM, and Nonvolatile SRAM (nvSRAM).

This application note describes the accelerated neutron testing procedure and test conditions that are applied during device qualification for Cypress SRAM devices. It covers Synchronous SRAM, Asynchronous SRAM, More Battery Life™ MoBL® SRAM, and Nonvolatile SRAM (nvSRAM) but does not contain soft error rate (SER) data for any of the SRAMs. Individual datasheets for Synchronous SRAMs list the derived accelerated neutron failure rates.

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Reliability and business continuity are of utmost importance for us. Hence, we remain fully committed to honoring existing customer and distributor relationships. This includes offering the legacy Cypress product portfolio. We thank you very much for your trusting support.

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