AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates | Cypress Semiconductor
AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates
This application note describes the accelerated neutron testing procedure and test conditions that are applied during device qualification for Cypress SRAM devices. It covers Synchronous SRAM, Asynchronous SRAM, More Battery Life™ MoBL® SRAM, and Nonvolatile SRAM (nvSRAM) but does not contain soft error rate (SER) data for any of the SRAMs. Individual datasheets for Synchronous SRAMs list the derived accelerated neutron failure rates.
Dear valued customer,
Thank you for choosing our products. They come with all the know-how and passion that our engineers have put into it. As you probably already know, Cypress is now Infineon. This is a major step for our company, but also for the good of you.
Reliability and business continuity are of utmost importance for us. Hence, we remain fully committed to honoring existing customer and distributor relationships. This includes offering the legacy Cypress product portfolio. We thank you very much for your trusting support.
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관련 파일
파일 제목 | 언어 | Size | 최신 업데이트 |
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영어 | 465.15 KB | 2021/03/02 |
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중국어 | 546.05 KB | 2015/08/20 |
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일본어 | 645.79 KB | 2015/08/20 |
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