S29GL256S10TFA023 | Cypress Semiconductor
S29GL256S10TFA023
| 인증 자동차 | Y |
| Density (Mbit) | 256 |
| Initial Access Time (ns) | 100 |
| 인터페이스 | Parallel |
| Interface Frequency (SDR / DDR) (MHz) | NA |
| 최대 작동 온도(°C) | 85 |
| 최대 작동 전압(V) | 3.60 |
| 최소 작동 온도(°C) | -40 |
| 최소 작동 전압(V) | 2.70 |
| Operating Voltage (V) | 3 |
| Page Access Time (ns) | 15 |
| Part Family | Parallel NOR |
| Series | GL-S |
| Tape & Reel | Y |
| Temperature Range (Min C to Max C) | -40C to +85C |
Pricing & Inventory Availability
| 1-9 unit Price* | 10-24 unit Price* | 25-99 unit Price* | 100-249 unit Price* | 250-999 unit Price* | 1000+ unit Price* |
|---|---|---|---|---|---|
| $7.99 | $6.72 | $5.99 | $5.26 | $4.97 | $4.65 |
Packaging/Ordering
Quality and RoHS
Moisture Sensitivity Level (MSL)
Peak Reflow Temp. (°C)
260 (Cypress Reflow Profile)
RoHS 준수
Y
무연
Y
Lead/Ball Finish
Matte Tin Plating
Marking
기술 문서
애플리케이션 설명 (25)
2021년 3월 03일
2021년 3월 02일
제품 변경 고지(PCN) (1)
2020년 4월 14일
Qualification of XMC as an Additional Wafer Fab Site for Automotive GL-S NOR Flash Memory Products
Advanced Product Change Notice (APCN) (9)
2020년 4월 23일
Addendum to APCN181801 - Planned Qualification of Tera Probe, Inc. Japan as an Additional Wafer Test (Sort) Site for GL-S Product Family
2020년 4월 14일
Addendum to Advance PCN181801A - Planned Qualification of Tera Probe, Inc. Japan as an Additional Wafer Test (Sort) Site for GL-S Product Family
Product Information Notice (PIN) (1)
2020년 4월 14일
Qualification of WXIC, China as an Additional Wafer Foundry Site for 65nm GL-S MirrorBit® Eclipse Flash Memory Products
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